Charging Principles of Supercapacitors and Charger Selection The charging process of a supercapacitor essentially involves ...

The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...

Several Design Ideas (DIs) have employed the subject ICs to implement programmable current sources in an innovative manner [Editor’s note: DIs referenced in “Related Content” below]. Figure 1 shows ...

The TL431 has been around for nearly 50 years. During those decades, while primarily marketed as a precision adjustable shunt regulator, this legacy device also found its way into alternative ...