An unsatisfying compromise has to be made between acceptable throughput and sufficient data coverage when measuring high-slope machined parts, since metrology tools usually involve some sort of ...

Non-destructive and accurate characterization of high aspect ratio (HAR) and composite micro-trenches is essential for semiconductor inspection in fields like microelectromechanical systems (MEMS) and ...

Surface metrology has to increasingly deal with the presence of sub-micron thick films, which are now being used on products well beyond semiconductor devices. Sub-micron films may be incidental – for ...

Stellar intensity interferometry is a powerful observational technique that exploits second-order coherence properties of starlight to achieve extremely high angular resolution. Building on the ...

(Nanowerk News) Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and ...

To assess the validity and repeatability of partial coherence interferometry (IOLMaster) and A-scan ultrasound measurement of axial length (AL) in children. A prospective comparison of AL measurement ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

The fiber itself is used as a transducer in many fiber optic sensing systems (see the section titled “Fiber Sensors,” in ADVANCES IN OPTICAL METROLOGY, the section titled “Optical Fiber Sensors,” in ...

A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light. A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light ...